著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
M. Morifuji and K. Taniguchi and T. Kai and M. Yamaguchi and C. Hamaguchi,Electroreflectance measurements of triple quantum well structures,International Electron Devices and Materials Symposium,,IEEE,2005-08-24,,,10-5,https://cir.nii.ac.jp/crid/1872835442422735744,https://doi.org/10.1109/edms.1994.771289