著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Kunihiro Asada and Satoshi Komatsu and James S. Tandon and Takahiro Yamaguchi,A novel test structure for measuring the threshold voltage variance in MOSFETs,2013 IEEE International Test Conference (ITC),,IEEE,2013-09-01,,,1-8,https://cir.nii.ac.jp/crid/1872835442656710400,https://doi.org/10.1109/test.2013.6651878