著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Y. Ohtani and Osamu Nishikawa and K. Tanaka and J. Itoh and T. Sekine and K. Maeda and M. Watanabe,Atom-by-atom analysis of microtip emitter surfaces by the scanning atom probe,"Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena",1071-1023,American Vacuum Society,1999-03-01,17,,608-612,https://cir.nii.ac.jp/crid/1872835442800531712,https://doi.org/10.1116/1.590604