著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
M. Sekine and Kazuyoshi Kohno,FUNTASSI: A functional test generation assistant,Proceedings of IEEE Custom Integrated Circuits Conference - CICC '93,,IEEE,2002-12-30,,,26.3.1-26.3.4,https://cir.nii.ac.jp/crid/1872835442985321216,https://doi.org/10.1109/cicc.1993.590780