著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Hideo Fujiwara and Michiko Inoue and C. Jinno,An extended class of sequential circuits with combinational test generation complexity,Proceedings. IEEE International Conference on Computer Design: VLSI in Computers and Processors,,IEEE Comput. Soc,2003-06-26,,,200-205,https://cir.nii.ac.jp/crid/1873116917486165248,https://doi.org/10.1109/iccd.2002.1106770