著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
H. Suzuki and Kohji Hohkawa and H. Shiraishi and Satoru Noge and Kenji Komine and N. Araki,AFM and TEM measurement of the microscopic surface structure of a quartz substrate,1997 IEEE Ultrasonics Symposium Proceedings. An International Symposium (Cat. No.97CH36118),,IEEE,2002-11-22,1,,285-288,https://cir.nii.ac.jp/crid/1873116917560732032,https://doi.org/10.1109/ultsym.1997.663025