Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Katsuro Inoue and Takeshi Hattori and Norihiro Yoshida,Finding similar defects using synonymous identifier retrieval,Proceedings of the 4th International Workshop on Software Clones,,ACM,2010-05-08,,,49-56,https://cir.nii.ac.jp/crid/1873116917677107712,https://doi.org/10.1145/1808901.1808908