Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Ken Suzuki and Hideo Miura and Osamu Asai and Chuanhong Fan and Ryosuke Furuya,Improvement of the Reliability of Thin-Film Interconnections Based on the Control of the Crystallinity of the Thin Films,Volume 1: Advanced Packaging; Emerging Technologies; Modeling and Simulation; Multi-Physics Based Reliability; MEMS and NEMS; Materials and Processes,,American Society of Mechanical Engineers,2013-07-16,,,,https://cir.nii.ac.jp/crid/1873398392414273280,https://doi.org/10.1115/ipack2013-73149