著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Y. Uchikawa and Xiaoyuan Li and T. Kodama,Genetic algorithms as applied to line profile reconstruction in the scanning electron microscope,"2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.00CH37141)",,IEEE,2002-11-11,4,,2798-2802,https://cir.nii.ac.jp/crid/1873398392437751424,https://doi.org/10.1109/iecon.2000.972441