Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
R. Takahasi and Makoto Murakami and Parhat Ahmet and X. J. Fan and Masashi Kawasaki and Tomoteru Fukumura and Yuji Matsumoto and Tsuyoshi Hasegawa and Takashi Koida and Hideomi Koinuma and Toyohiro Chikyow,High throughput characterization of magnetic semiconductor thin films with a scanning SQUID microscope,MRS Proceedings,0272-9172,Springer Science and Business Media LLC,2001-01-01,700,,,https://cir.nii.ac.jp/crid/1873398392459790720,https://doi.org/10.1557/proc-700-s2.7