Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
N. Onodera and Kenichi Okada,Statistical modeling of device characteristics with systematic fluctuation,2000 IEEE International Symposium on Circuits and Systems. Emerging Technologies for the 21st Century. Proceedings (IEEE Cat No.00CH36353),,Presses Polytech. Univ. Romandes,2002-11-07,2,,437-440,https://cir.nii.ac.jp/crid/1873398392518401536,https://doi.org/10.1109/iscas.2000.856358