著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
T. Imai and T. Morishita and M. Saigusa and M. Sugimoto and S. Sazawa and S. Maebara and H. Takeuchi,Low power test of RFQ mock-up modules at 175MHz for IFMIF project,Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440),,IEEE,2004-07-08,4,,2829-2831,https://cir.nii.ac.jp/crid/1873398392634994432,https://doi.org/10.1109/pac.2003.1289285