Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Y. Kurui and Yasumasa Tanishiro and Yuki Ohshima and Kunio Takayanagi,Aberration Corrected Microscopy and Spectroscopy for Pico-meter Characterization of Device Materials - Coductance Quantization of Metal Nanowire and AtomicChain - (Invited),Extended Abstracts of the 2008 International Conference on Solid State Devices and Materials,,The Japan Society of Applied Physics,2008-09-24,,,,https://cir.nii.ac.jp/crid/1873398392882117632,https://doi.org/10.7567/ssdm.2008.c-1-4