著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Masanori Hashimoto and Hideya Matsuyama and Takashi Kato and Taiki Uemura,Soft error immune latch design for 20 nm bulk CMOS,2015 IEEE International Reliability Physics Symposium,,IEEE,2015-04-01,,,SE.4.1-SE.4.6,https://cir.nii.ac.jp/crid/1873679867767558144,https://doi.org/10.1109/irps.2015.7112825