Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Kozo Kinoshita and H. Ueda,Low power design and its testability,Proceedings of the Fourth Asian Test Symposium,,IEEE Comput. Soc. Press,2002-11-19,,,361-366,https://cir.nii.ac.jp/crid/1873679868058391424,https://doi.org/10.1109/ats.1995.485361