著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
D. Sajoto and Helmut Puchner and J. Tandigan and K. Shakeri and S. Lakshminarayanan and K. Jang and M.V.R. Reddy and Ravindra Kapre and M. Whately and T. Nigam,SRAM Variability and Supply Voltage Scaling Challenges,2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual,,IEEE,2007-04-01,,,23-28,https://cir.nii.ac.jp/crid/1874242817495206528,https://doi.org/10.1109/relphy.2007.369863