著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Fujiwara and Larsson,Optimal system-on-chip test scheduling,Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03,,IEEE,2003-01-01,,,306-311,https://cir.nii.ac.jp/crid/1874242817541237888,https://doi.org/10.1109/ats.2003.1250828