Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
K. Miura and Akihiro Takakura and Akinori Ohshita and Koichi Hata and Yahachi Saito,Interference fringes observed in electron emission patterns of a multi-wall carbon nanotube,IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479),,Japan Soc. Promotion of Sci,2004-03-01,,,55-56,https://cir.nii.ac.jp/crid/1874242817755424256,https://doi.org/10.1109/ivmc.2003.1222980