Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Shigeki Minegishi and Risaburo Sato and Akira Haga and Ken Kawamata,Very fast time domain measurement of voltage rising part due to micro gap discharge in air,1999 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.99EX147),,IEICE of Japan,2003-01-20,,,118-121,https://cir.nii.ac.jp/crid/1874242817779147520,https://doi.org/10.1109/elmagc.1999.801277