Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
A. Tohata and Tomoaki Yabe and Osamu Hirabayashi and Y. Takeyama and A. Suzuki and Keiichi Kushida and Nobuaki Otsuka and Atsushi Kawasumi,DFT techniques for wafer-level at-speed testing of high-speed SRAMs,Proceedings. International Test Conference,,IEEE,2003-06-25,,,164-169,https://cir.nii.ac.jp/crid/1874242817789782912,https://doi.org/10.1109/test.2002.1041757