著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Koichi Kanzaki and K. Maeguchi and Y. Hiruta,Impact of hot electron trapping on half micron PMOSFETs with p<sup>+</sup>poly Si gate,1986 International Electron Devices Meeting,,IRE,1986-01-01,,,718-721,https://cir.nii.ac.jp/crid/1874242817856550912,https://doi.org/10.1109/iedm.1986.191294