Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Y. Watanabe and T. Kato and S. Hashimoto and Sadamu Ohteru,Theoretical analysis of longevity testing on bubble memory devices,IEEE Transactions on Magnetics,0018-9464,Institute of Electrical and Electronics Engineers (IEEE),1980-11-01,16,,1399-1403,https://cir.nii.ac.jp/crid/1874242817884502912,https://doi.org/10.1109/tmag.1980.1060878