著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Koichiro Shibayama and Kenji Tsuchiya and Kazumasa Endo and Yuuichiro Yamazaki and Kiminori Yoshino and Akitoshi Kawai and Makoto Oote,Hole inspection technology using Fourier imaging method,SPIE Proceedings,0277-786X,SPIE,2009-03-13,7272,,72723H,https://cir.nii.ac.jp/crid/1874242817906818688,https://doi.org/10.1117/12.813634