著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Michael F. Rubner and Seimei Shiratori and Takahiro Ito and Masayoshi Yamada and Tom C. Wang,Nanoscale Control of Layer Thickness for EL Devices by Mass-controlled Layer-by-layer Sequential Adsorption Process,MRS Proceedings,0272-9172,Springer Science and Business Media LLC,1999-01-01,598,,,https://cir.nii.ac.jp/crid/1874242817995037184,https://doi.org/10.1557/proc-598-bb1.9