著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Krishnendu Chakrabarty and Thomas Edison Yu and Hideo Fujiwara and Tomokazu Yoneda,Thermal-Safe Test Access Mechanism and Wrapper Co-optimization for System-on-Chip,16th Asian Test Symposium (ATS 2007),,IEEE,2007-10-01,,,187-192,https://cir.nii.ac.jp/crid/1874242818017003392,https://doi.org/10.1109/ats.2007.53