{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1892272492573395584.json","@type":"Researcher","foaf:Person":[{"foaf:name":[{"@value":"Kentaro Kinoshita"}]}],"product":[{"@id":"https://cir.nii.ac.jp/crid/1872272492573395584","@type":"Article","productIdentifier":[{"@type":"DOI","@value":"10.1557/opl.2012.66"}],"notation":[{"@value":"Resistance Change Caused by Electrochemically Induced Carrier Injection in NiO Films."}],"relation":[{"type":"creator"}]}],"dataSourceIdentifier":[{"@type":"OPENAIRE","@value":"doi_dedup___::3640286ee3e52b81809231aa12750f37_HrFni0XuwF041f3y5IYj9JJd2Zm"}]}