URL,Title,Author,University,Degree year,Grant ID,Types of degree,DOI,URL(DOI)
https://cir.nii.ac.jp/crid/1910020910745615232,Internal Stark Effect Caused by Inhomogeneous Distribution of Ionized Impurities in Highly Compensated Semiconductors,"Harada, Yoshiyuki",大阪大学,1995,甲第05152号,博士（理学）,10.11501/3100504,https://doi.org/10.11501/3100504