[Updated on July 12] Integration of CiNii Articles into CiNii Research from April 1, 2022

First-principles study of leakage current throught thin SiO_2 films

Bibliographic Information

Title
First-principles study of leakage current throught thin SiO_2 films
Author
Daisuke Nakagawa, Katsuhiro Kutsuki, Tomoya Ono, Kikuji Hirose

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Details

  • CRID
    1010000781949544448
  • Article Type
    journal article
  • Data Source
    • KAKEN
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