[Updated on July 12] Integration of CiNii Articles into CiNii Research from April 1, 2022

A CMOS SRAM test cell design using selectively metal-covered transistors for a laser irradiation failure analysis

Bibliographic Information

Title
A CMOS SRAM test cell design using selectively metal-covered transistors for a laser irradiation failure analysis
Author
H. Hatano

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Details

  • CRID
    1010000782081498753
  • Article Type
    journal article
  • Data Source
    • KAKEN
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