[Updated on July 12] Integration of CiNii Articles into CiNii Research from April 1, 2022

Crack tip dislocations ovserved by TEM葉omography in silicon single crsytals

Bibliographic Information

Title
Crack tip dislocations ovserved by TEM葉omography in silicon single crsytals
Author
S. Sadamatsu, M. Tanaka, M. Honda, K. Higashida

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Details

  • CRID
    1010000782135102213
  • Article Type
    journal article
  • Data Source
    • KAKEN
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