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Electronic transition in high-pressure low temperature CePd_2Si_2 studied by resonant x-ray emission spectroscopy

Bibliographic Information

Title
Electronic transition in high-pressure low temperature CePd_2Si_2 studied by resonant x-ray emission spectroscopy
Author
H. Yamaoka, Y. Zekko, A. Kotani, I. Jarriger, N. Tsujii, J.-F. Lin, J. Mizuki, N. Hiraoka, H. Ishii, K.-D. Tsuei, and J. Mizuki

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Details

  • CRID
    1010282257096492545
  • Article Type
    journal article
  • Data Source
    • KAKEN
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