[Updated on July 12] Integration of CiNii Articles into CiNii Research from April 1, 2022

Multiresistance Characteristics of PCRAM With $ \hbox{Ge}_{1}\hbox{Cu}_{2}\hbox{Te}_{3}$ and $\hbox{Ge}_{2} \hbox{Sb}_{2}\hbox{Te}_{5}$ Films

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  • IEEE Electron Device Letters

    IEEE Electron Device Letters 33 (10), 1399-1401, 2012-10

    Institute of Electrical and Electronics Engineers (IEEE)

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