An Analytical Study on Jitter Accumulation in Interleaved Phase Frequency Detectors for High-Accuracy On-Chip Jitter Measurements
<jats:p>This work presents the analytical study on jitter accumulation in interleaved phase frequency detectors for high-accuracy on-chip jitter measurements. Jitter accumulation in phase frequency detector degrades the accuracy of on-chip jitter measurements, and required to be mitigated. In order to analyze and estimate the jitter accumulation in phase frequency detectors, SPICE simulation was performed with 65 nm CMOS technology. Simulation results show that, with a 50 mV power supply noise injection, jitter accumulation can be reduced from 1.03 ps to 0.49 ps (52% reduction) by using an interleaved architecture.</jats:p>
- Key Engineering Materials
Key Engineering Materials 534 197-205, 2013-01
Trans Tech Publications, Ltd.