Atomically resolved imaging by low-temperature frequency-modulation atomic force microscopy using a quartz length-extension resonator

Bibliographic Information

Title
Atomically resolved imaging by low-temperature frequency-modulation atomic force microscopy using a quartz length-extension resonator
Author
T. An, T. Nishio, T. Eguchi, et al.

Journal

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Details

  • CRID
    1010000781667018241
  • Article Type
    journal article
  • Data Source
    • KAKEN

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