Long-lived Charge-Separated State Leading to DNA Damage through Hole Transfer

  • KAWAI Kiyohiko
    Osaka University, The Institute of Scientific and Industrial Research, Research Associate

Bibliographic Information

Title
Long-lived Charge-Separated State Leading to DNA Damage through Hole Transfer
Author
Kiyohiko Kawai

Journal

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Details

  • CRID
    1010000781757805454
  • Article Type
    journal article
  • Data Source
    • KAKEN

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