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Long-lived Charge-Separated State Leading to DNA Damage through Hole Transfer
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- KAWAI Kiyohiko
- Osaka University, The Institute of Scientific and Industrial Research, Research Associate
Bibliographic Information
- Title
- Long-lived Charge-Separated State Leading to DNA Damage through Hole Transfer
- Author
- Kiyohiko Kawai
- Published
- 2003
- Resource Type
- journal article
Journal
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- J.Am.Chem.Soc.(Commun.) 125
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J.Am.Chem.Soc.(Commun.) 125 16198-16199, 2003
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Details 詳細情報について
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- CRID
- 1010000781757805454
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- Article Type
- journal article
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- Data Source
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- KAKEN