Long-lived Charge-Separated State Leading to DNA Damage through Hole Transfer
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- 川井 清彦
- 大阪大学
書誌事項
- タイトル
- Long-lived Charge-Separated State Leading to DNA Damage through Hole Transfer
収録刊行物
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- J.Am.Chem.Soc.(Commun.) 125
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J.Am.Chem.Soc.(Commun.) 125 16198-16199, 2003