- 【Updated on November 17, 2025】 Integration of CiNii Books into CiNii Research
- Trial version of CiNii Research Knowledge Graph Search feature is available on CiNii Labs
- 【Updated on November 26, 2025】Regarding the recording of “Research Data” and “Evidence Data”
- CiNii Research researchers search function has been released.
- Regarding the suspension of updates to the "BOOK" database data
Focusing and Positioning of Ion Beam for Sputter Depth Profiling using a Coaxicial Sample Stage and a Dual Nano-ammter
Bibliographic Information
- Title
- Focusing and Positioning of Ion Beam for Sputter Depth Profiling using a Coaxicial Sample Stage and a Dual Nano-ammter
- Author
- M.Inoue, K.Kurahashi, K.Kodama
Journal
-
- J.Surf.Anal. Vol.10
-
J.Surf.Anal. Vol.10 197-202, 2003
- Tweet
Details 詳細情報について
-
- CRID
- 1010000781812556806
-
- Article Type
- journal article
-
- Data Source
-
- KAKEN