On Per-Test Fault Diagnosis Using the X-Fault Model
書誌事項
- タイトル
- On Per-Test Fault Diagnosis Using the X-Fault Model
- 著者
- X.Wen, T.Miyoshi, S.Kajihara, L.T.Wang, K.K.Saluja, K.Kinoshita
収録刊行物
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- Proceedings of Int'l Conf.on Computer-Aided Design
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Proceedings of Int'l Conf.on Computer-Aided Design 633-640, 2004