On Per-Test Fault Diagnosis Using the X-Fault Model
Bibliographic Information
- Title
- On Per-Test Fault Diagnosis Using the X-Fault Model
- Author
- X.Wen, T.Miyoshi, S.Kajihara, L.T.Wang, K.K.Saluja, K.Kinoshita
Journal
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- Proceedings of Int'l Conf.on Computer-Aided Design
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Proceedings of Int'l Conf.on Computer-Aided Design 633-640, 2004
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Details
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- CRID
- 1010000781878314376
-
- Article Type
- journal article
-
- Data Source
-
- KAKEN
