Radiation-induced defects in SiC-MESFETs after 2-MeV electron irradiation
書誌事項
- タイトル
- Radiation-induced defects in SiC-MESFETs after 2-MeV electron irradiation
- 著者
- H.Ohyama et al.
収録刊行物
-
- Physica B 376-377
-
Physica B 376-377 382-384, 2006
