Recent Novel X-ray Reflectivity Techniques : Moving Towards Quicker Measurement to observe Changes at Surface and Buried Interfaces

Bibliographic Information

Title
Recent Novel X-ray Reflectivity Techniques : Moving Towards Quicker Measurement to observe Changes at Surface and Buried Interfaces
Author
K.Sakurai, M.Mizusawa, M.Ishii

Journal

Related Projects

See more

Details 詳細情報について

  • CRID
    1010000781986125184
  • Article Type
    journal article
  • Data Source
    • KAKEN

Report a problem

Back to top