Effect of film thickness on ferroelectric domain structure and properties of Pb(Zr_<0.35>Ti_<0.65>)O_3/SrRuO_3/SrTiO_3 heterostructures
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- 舟窪 浩
- Tokyo Institute of Technology
Bibliographic Information
- Title
- Effect of film thickness on ferroelectric domain structure and properties of Pb(Zr_<0.35>Ti_<0.65>)O_3/SrRuO_3/SrTiO_3 heterostructures
- Author
- Hitoshi Morioka, Keisuke Saito, Shintaro Yokoyama, Takahiro Oikawa, Toshiyuki Kurosawa, Hiroshi Funakubo
Journal
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- J.Mater.Sci. 44
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J.Mater.Sci. 44 5318-5324, 2009
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Details
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- CRID
- 1010000782026541696
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- Article Type
- journal article
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- Data Source
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- KAKEN