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High-pressure in situ structure measurement of low-Z noncrystalline materials with a diamond-anvil cell by an x-ray diffraction method
Bibliographic Information
- Title
- High-pressure in situ structure measurement of low-Z noncrystalline materials with a diamond-anvil cell by an x-ray diffraction method
- Author
- T.Sato
Journal
-
- Review of Scientific Instruments
-
Review of Scientific Instruments 81 43906-, 2010
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Details 詳細情報について
-
- CRID
- 1010000782034354952
-
- Article Type
- journal article
-
- Data Source
-
- KAKEN
