A Method for Diagnosing Resistive Open Faults with Considering Adjacent Lines
書誌事項
- タイトル
- A Method for Diagnosing Resistive Open Faults with Considering Adjacent Lines
- 著者
- Hiroshi Takahashi, Yoshinobu Higami, Yuzo Takamatsu, Koji Yamazaki, Toshiyuki Tsutsumi, Hiroyuki Yotsuyanagi, Masaki Hashizume
収録刊行物
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- Proc.IEEE 10th International Symposium on Communications and Information Technologies
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Proc.IEEE 10th International Symposium on Communications and Information Technologies 609-614, 2010
