Quasi-Static Frictional Test between Silicon Sharp Probes with in-situ TEM Observation of Real Contact Point

Bibliographic Information

Title
Quasi-Static Frictional Test between Silicon Sharp Probes with in-situ TEM Observation of Real Contact Point
Author
T.Ishida, T.Sato, S.Nabeya, H.Fujita

Journal

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Details 詳細情報について

  • CRID
    1010000782061557395
  • Article Type
    journal article
  • Data Source
    • KAKEN

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