Quasi-Static Frictional Test between Silicon Sharp Probes with in-situ TEM Observation of Real Contact Point
Bibliographic Information
- Title
- Quasi-Static Frictional Test between Silicon Sharp Probes with in-situ TEM Observation of Real Contact Point
- Author
- T.Ishida, T.Sato, S.Nabeya, H.Fujita
Journal
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- Journal of Physics : Conference Series
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Journal of Physics : Conference Series 258 2010
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Details 詳細情報について
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- CRID
- 1010000782061557395
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- Article Type
- journal article
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- Data Source
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- KAKEN