Quasi-Static Frictional Test between Silicon Sharp Probes with in-situ TEM Observation of Real Contact Point
書誌事項
- タイトル
- Quasi-Static Frictional Test between Silicon Sharp Probes with in-situ TEM Observation of Real Contact Point
- 著者
- T.Ishida, T.Sato, S.Nabeya, H.Fujita
収録刊行物
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- Journal of Physics : Conference Series
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Journal of Physics : Conference Series 258 2010