Characterization of nonvolatile memory behaviors of Al/poly (vinylidene fluoridetrifluoroethylene)/Al_2O_3/ZnO thin-film transistors
Bibliographic Information
- Title
- Characterization of nonvolatile memory behaviors of Al/poly (vinylidene fluoridetrifluoroethylene)/Al_2O_3/ZnO thin-film transistors
- Author
- S-M.Yoon, S-H.Yang, C-W.Byun, S-H.K.Park, S-W.Jung, D-H.Cho, S-Y.Kang, C-S.Hwang, H.Ishiwara
Journal
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- Jpn.J.Appl.Phys.
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Jpn.J.Appl.Phys. 49 2010
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Details
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- CRID
- 1010000782461472522
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- Article Type
- journal article
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- Data Source
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- KAKEN