Estimation of Delay Test Quality and Its Application to Test Generation
書誌事項
- タイトル
- Estimation of Delay Test Quality and Its Application to Test Generation
- 著者
- S. Kajihara, S. Morishima, M. Yamamoto, X. Wen, M. Fukunaga, K. Hatayama, T. Aikyo
収録刊行物
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- IPSJ Transaction of System LSI Design Methodology Vol.1
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IPSJ Transaction of System LSI Design Methodology Vol.1 104-115, 2008