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Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment
Bibliographic Information
- Title
- Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment
- Author
- M.-F. Wu, J.-L. Huang, X. Wen, K. Miyase
Journal
-
- IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems Vol.28,No.11
-
IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems Vol.28,No.11 1767-1776, 2009
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Details 詳細情報について
-
- CRID
- 1010000782469395718
-
- Article Type
- journal article
-
- Data Source
-
- KAKEN
