Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment
Bibliographic Information
- Title
- Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment
- Author
- M.-F. Wu, J.-L. Huang, X. Wen, K. Miyase
Journal
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- IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems Vol.28,No.11
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IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems Vol.28,No.11 1767-1776, 2009
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Details 詳細情報について
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- CRID
- 1010000782469395718
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- Article Type
- journal article
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- Data Source
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- KAKEN