In-situ measurement of molecular orientation of the pentacene ultrathin films grown on SiO_2 substrates
Bibliographic Information
- Title
- In-situ measurement of molecular orientation of the pentacene ultrathin films grown on SiO_2 substrates
- Author
- G. Yoshikawa, T. Miyadera, K. Ueno, R. Onoki, I. Nakai, S. Entani, S. Ikeda, D. Guo, M. Kiguchi, H. Kondoh, T. Ohta, K. Saiki
Journal
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- Surface Science 600
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Surface Science 600 2518-2522, 2006
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Details
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- CRID
- 1010282256772616964
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- Article Type
- journal article
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- Data Source
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- KAKEN