Design and Development of Electrostatically-driven Uniaxial Test Device for Silicon Nanowires
Open Access
Bibliographic Information
- Title
- Design and Development of Electrostatically-driven Uniaxial Test Device for Silicon Nanowires
- Author
- Tatsuya Fujii, Koichi Sudoh, Shozo Inoue, and Takahiro Namazu
Journal
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- Sensors and Materials
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Sensors and Materials 28 89-102, 2016
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Details
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- CRID
- 1010282256774859136
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- Article Type
- journal article
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- Data Source
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- KAKEN